Used ADVANTEST Q82215 #9064333 for sale

ADVANTEST Q82215
ID: 9064333
Optical sensors, 1210 nm.
ADVANTEST Q82215 is a high-performance and accuracy electronic test equipment that provides complete testing solutions for a variety of applications such as aerospace, automotive, and healthcare. It is a fast, versatile, and cost-effective system that delivers high degree of accuracy and reliability. Q82215 unit delivers random and periodic jitter testing and provides complete control over test parameters, with a built-in programmable high-speed clock generator and wideband jitter measurement capability. The machine's jitter filter taps offer more than 80 dB rejection of unwanted noise. ADVANTEST Q82215 tool is used to generate and analyze pulse signals with pulse widths of up to 500 microseconds. This asset can also measure pulse rise and fall times of up to 4 ns, plus the duration of the pulse itself in increments of picoseconds. It is compatible with multiple devices such as PXI, VXI, PCI, FPGA, ASIC, and ICs. It is also capable of operating in single- or dual-channel modes. Q82215 model supports parallel segmented timing, which allows users to select multiple segments from a single pulse. This feature reduces device-specific programming thus providing a lower cost of ownership. It also utilizes the latest LVDS transmitter test methods, including the IEEE 1149.4 Serial Link Layer Protocol (SLMP) for digital testing. Furthermore, ADVANTEST Q82215 equipment supports a wide range of measurements such as total jitter, cycle-to-cycle jitter, random jitter, additive jitter, peak-to-peak jitter, and rms jitter. It also measures clock phase and amplitude, correlation, phase jitter, sampling frequency, and cycle skew. Q82215 system is designed to suit any high-performance test requirement and is ideal for high-frequency applications, ensuring reliable performance and accuracy in all types of high-speed electronic test applications. It is an extremely versatile test unit that provides all the features needed for advanced high-speed testing and debugging.
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