Used KAELUS IBA-2600A #293600144 for sale

ID: 293600144
Vintage: 2021
PIM Analyzer 2021 vintage.
KAELUS IBA-2600A is a highly advanced piece of electronic test equipment designed to measure the full characteristics of components and systems. Its capabilities include RF and microwave measurements with extremely low phase noise, frequency range of up to 43 GHz, high dynamic range measurements, digital and analog modulation, wide-bandwidth swept measurements, and pulse modulation/switched measurements. IBA-2600A's patent-pending Multi-Receiver Architecture provides a true measure of receiver performance while its low noise synthesizer allows for a wide range of measurements. It includes an integrated 10 MHz reference clock and a powerful analysis core with an onboard CPU. This allows for fast, accurate, and repeatable measurements on multiple channels simultaneously. KAELUS IBA-2600A also has the ability to interface with different sources and receivers, providing broad compatibility with both legacy and cutting-edge technologies. This allows for comprehensive RF and microwave test builds with a large number of available outputs and input sources. In addition, IBA-2600A has a particularly strong performance level in the area of vector signal analysis and measurements. It includes an integrated real-time oscilloscope, a digital modulation analyzer, and a vector signal trace module. It also includes an integrated radio waveset viewer which allows users to easily view and evaluate a large variety of modulation patterns, AM/FM/PM signals, pulse modulation, and swept measurement modes. KAELUS IBA-2600A is an extremely capable test and measurement instrument with an ease of control, offering an ideal combination of wide frequency range coverage along with rich feature set and strong analytical performance. Its convenient touchscreen and navigation display, offers users a fast, intuitive, and user-friendly graphical user interface. This means that users of IBA-2600A can easily interact with their data, offering in-depth insight into the performance of any device being characterized.
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