Used HORIBA UVISEL #293622186 for sale

Manufacturer
HORIBA
Model
UVISEL
ID: 293622186
Ellipsometer.
HORIBA UVISEL is an industry-leading precision ellipsometer used to measure the thickness and optical properties of layers that are on the order of a few nanometers in thickness. The unique design of UVISEL allows for photo-electrochemical measurements on a wide range of materials like oxide films, polymers films, proteins, and other nanostructures. HORIBA UVISEL is a model of ellipsometry renowned for its high accuracy and precision. It works by shining polarized light on a sample's surface, which causes its polarization to be changed in a way that can be measured by the instrument. This change is a result of the physical and optical properties of the surface layers and related optical interference. The instrument features an exceptionally wide range of angular resolution, ranging from 0.001° to 10° with an accuracy of 0.1°. This allows for the characterization of denser, thicker materials as well as extremely thin layers, making it one of the most versatile instruments in its class. UVISEL also boasts robust design, near infrared detection capabilities, high sensitivity, and highly accurate temperature control. HORIBA UVISEL is capable of providing repeatable and reliable results, making it the perfect choice for applications requiring precise and accurate measurements of thin layers on a wide range of materials. The instrument's capabilities, combined with a large selection of software packages and automatic calibration functions, make it one of the most advanced and user-friendly ellipsometers on the market. In addition, its modular design allows for different analysis configurations and easy upgradeability for a better, faster, and more accurate experience. Furthermore, UVISEL comes with a wide range of accessories, allowing for a greater degree of customization with enhanced performance. The capabilities of HORIBA UVISEL have made it an indispensible tool in the semiconductor and optics industries, where reliable and accurate measurements of thin layers are of utmost importance. The instrument stands out for its capability to handle samples of various thicknesses, its repeatability, and its user-friendly, modular design that makes it versatile and upgradable.
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