Used JASCO M-220 #293671407 for sale

JASCO M-220
Manufacturer
JASCO
Model
M-220
ID: 293671407
Ellipsometer.
JASCO M-220 is an automated ellipsometer developed by JASCO Corporation. This state-of-the-art instrument can be used to measure and analyze the optical properties of thin films and other materials. M-220 features a simple, user-friendly design, allowing for easy operation and maintenance. The equipment consists of a measuring head, a high-resolution camera and a laser and photo detector, all mounted on an adjustable rotating base. JASCO M-220 has an integrated tilting mirror design that eliminates the need for external moving parts. This allows for greater accuracy in measuring the optical properties of the sample. The instrument is optimized for thin film measurement with a range of 0.1nm to several micrometers. M-220 is capable of measuring both specular and polarized reflectance. The instrument's polarized spectrophotometric measurements provide the correct angle of incidence and the optical data is acquired at multiple angles of incidence. Additionally, the instrument is equipped with a precise polarization device, making full polarization measurements possible. JASCO M-220 features a fast response time and high data throughput, allowing for quick and accurate measurements of thin films. The system has a resolution of 0.1 nanometers, making it suitable for measuring ultra-thin films and nanostructured materials. The unit is able to control the angle of the incident beam up to 3 degrees and the incident power level up to 5mW. The instrument also features an automatic background subtraction and a temperature control machine. In addition to its advanced measurement capabilities, M-220 also offers an array of analysis tools. This includes a software interface which provides a range of options for plotting and understanding the acquired data. Its unique algorithms allow for effective calculation of complex film stacks. Overall, JASCO M-220 is a highly advanced ellipsometer designed for easy operation and fast, accurate measurements of thin films and nanomaterials. This powerful instrument offers a range of features and analysis tools which make it a versatile tool for scientific research and industrial applications.
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