Used SEMILAB IR 3100s #9298698 for sale

SEMILAB IR 3100s is a state-of-the-art Ellipsometer from SEMILAB that enables rapid and accurate measurements of thin film samples. Ellipsometry is a type of light scattering technique which is used to determine the thickness and refractive index of transparent uniform films ranging from nanometers (nm) to hundreds of nanometers. IR 3100s Ellipsometer uses a patented interference-reflection technique to study thin film properties. The instrument is based on the principle of optical interference, and works by using dual beams of light from a green laser source at recording angles which are close to the Brewster angle of each of the materials being studied. The interference pattern generated by the two beams is detected by a polarization-sensitive detector which is then analyzed to derive information on thickness and optical properties of the film. The system is equipped with three illumination and three detection modes allowing users to analyze a wide range of samples, from films with no visible contrast to monolayers of complex materials such as layered semiconductor materials. The user-friendly software allows for automated analysis, facilitating the measurement of single or multiple samples. In addition, live display of the ellipsometric curves for each sample ensures real-time analysis for each measurement. SEMILAB IR 3100s Ellipsometer has a repeatability of 0.8% and accuracy of 0.7%. It is a valuable tool for quality assessment and failure analysis applications, allowing for non-destructive measurement of the optical properties of transparent films. It is often used in a variety of industries, including semiconductors, optics, optical coating, solar and flat panel displays. IR 3100s Ellipsometer is equipped with a variety of features including automatic background subtraction, improved USP functionality, a built-in calibration feature, and a high-speed imaging CCD camera. The software provides a range of features for analyzing various sample properties and allows the user to compare real samples with simulated results. Thanks to the instrument's flexibility and modular design, it is easily customizable to meet any research or industrial application needs.