Used SENTECH SE 400 #9227072 for sale

SENTECH SE 400 is an advanced ellipsometer, designed for quickly and accurately measuring the optical and electrical properties of materials via ellipsometry. This device is capable of providing accurate results within seconds, using a single wavelength light source that is capable of a wide range of intensities and acquiring high-speed measurements. SENTECH SE400 uses a two-color polarization for maximum sensitivity, allowing measurements across an extended wavelength range. The light source is composed of two concurrent laser beams, which can be switched to adjust intensities and measure different material properties. The single wavelength light source gets split up by a collimator lens system into polarized beams, which then pass through a focusing optics arrangement. These have various apertures and lenses with which to choose and adjust the paths of the beams, depending on what properties are being studied. The ellipsometer also features an auto-focusing lock and a microscope objective with adjustable focus to achieve a variety of optical sampling conditions and to provide accurate results. The system supports both static and dynamic measurements of material samples, making it extremely versatile. SE 400 is a valuable tool for research and development of new materials, as well as for quality control applications. Its unique design allows for rotation of video microscope and ellipsometer, enabling simultaneous analysis of topography and anisotropic properties. SE400 comes with Windows compatible software for controlling the system, which includes several dedicated functions for in-depth analysis of results. Additionally, it has an analog signal output, which allows for connection of the ellipsometer to external systems for data acquisition and further processing. Overall, SENTECH SE 400 is a highly versatile and dependable ellipsometer that can be used in many applications, from material development to industrial quality control. This device is capable of quickly and accurately measuring the optical and electrical properties of materials, allowing for detailed analysis of sample properties.