Used ADVANTEST T 5335P #293610771 for sale

ADVANTEST T 5335P
Manufacturer
ADVANTEST
Model
T 5335P
ID: 293610771
Memory tester (4) BGR-019486 DC Boards (4) BGR-016796 PPS (16) BGL-020768 PE Cards (2) BGR-020816X02 FM Boards BGR-020771 Flash board (2) Memory banks BGR-020812 TG Board Option: (6) BGL-021040 PE Cards FM Module, 8M AFM Board, 1G Pattern memory, 144M MRA Function: MRAII SUN Workstation.
ADVANTEST T 5335P is a highly automated final test equipment designed for the production testing of various types of integrated circuits and semiconductors. The system offers a wide range of testing capabilities for advanced-node devices, enabling improved device quality, higher yields, and greater throughput. ADVANTEST T5335P includes both electrical test and analog test systems. The electrical test unit supports measurements from DC to 40GHz and test speeds of up to 20MHz. It is capable of testing up to 6 channels simultaneously and includes 16MB of memory for pattern storage. It also offers a slew rate measurement capability, which is useful for measuring small signals at a wide range of frequencies. The analog test machine allows for high precision tests from DC to 6GHz and test speeds up to 3MHz. It also features 16MB of memory and a digital data analysis capability. The tool is powered by a 32-bit RISC processor, allowing for programmability and high performance. It provides a comprehensive solution for final test of various device types, including transistors, logic ICs, and mixed signal devices. It can configure test parameters such as voltage, current, frequency, and pulse width, as well as various types of parametric tests such as leakage current, parametric scan, and calibration. In addition, it supports up to 8000 test pins, allowing for testing of high pin-count devices. The asset is equipped with an advanced user interface that enables easy set-up of test parameters and recipes. It also includes advanced data analysis capabilities, allowing for optimization of test results. Additionally, the model is fully automated and supports bidirectional communication via NFS. T 5335 P is designed to provide a reliable, efficient solution for final test of various types of integrated circuits and semiconductors. It offers a wide range of test capabilities that allows it to accurately test devices at advanced nodes, while its advanced user interface, programmability, and bidirectional communication makes it an ideal solution for high-volume production environments.
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