Used ADVANTEST T 5335P #9311746 for sale

ADVANTEST T 5335P
Manufacturer
ADVANTEST
Model
T 5335P
ID: 9311746
Vintage: 1996
Memory tester Temperature range: 150°C Tester processor: TP4 OS Rev: ASX/U-50: 6.04-1 SunOS Release 5.5.1 ASXUBASE: 2.02 DIAG5335SU (Tester diagnosis): 6.03G TH1: 650 OP1 Pin card OP2 Pin card TH2: 650 OP1 Pin card OP2 Pin card DPU: TH1 DC: 1-8 10V PPS: 1-16 HV PPS: 1-4 TH2: DC: 1-8 10V PPS: 1-16 HV PPS: 1-4 FM: 144 M (2) FM Boards Size of FM module: 1 M Memory bank (4) Memory blocks No patten memory BGR-020816 FM Board MRA: MRA Option: MRA2 Type of CBU board: BGR-019267 (2) CBU Boards Type of FBM board: 2 M, 72 Bit (4) FBM Boards No compression function FCDC: Flash option BGR-020774 SC Board 1996 vintage.
ADVANTEST T 5335P is a high-performance, multi-site final test equipment designed to meet production requirements for high-volume device testing. It features an intuitively designed GUI (Graphical User Interface) for easy operation and data gathering for maximum process efficiency. It utilizes a high-speed turret test head with a lift capacity of up to 2G, offering the highest throughput on the market and the smallest test head size to accommodate tight spaces. ADVANTEST T5335P is equipped with a flexible test adapter system with configurable channels that include single-ended digital, differential digital, and analog I/Os. Advanced multi-site testing capability is also provided, utilizing up to 816 independent sites in parallel test combinations. T 5335 P offers complete integration with wafer probers and handlers, allowing for seamless transfer of high-speed, multi-site test data. ADVANTEST T 5335 P also supports a wide range of test programs and automatic analysis, including digital pattern generation, cycle Time testing, and output load transient voltage and current measurements. The test unit allows for programmable pulse test options, allowing for the testing of short time events in real time. Furthermore, T5335P offers robust data logging capabilities for each test, enabling highly accurate real time analysis and compliance with regulatory requirements. To ensure maximum reliability, the test machine features a patented alignment technology used for ensuring contact on all contact points. It also features high power isolation transformers, multi-site OVP (output voltage protection) and OCP (output current protection) circuitry, as well as inrush current protection and the use of high quality gold plated spring pins for contact integrity. The tool also offers built in in-situ calibration capabilities to ensure accuracy. Overall, T 5335P is the perfect solution for modern production requirements for final test and post-test analysis. With the highest throughput on the market, configurable multi-site testing, and a high quality, durable design, ADVANTEST T 5335P is the ultimate production solution for device testing.
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