Used ADVANTEST T 5335P #9311753 for sale

ADVANTEST T 5335P Final Test Equipment is a powerful tool designed to meet the demanding requirements for the testing of high-end electronic devices. The system is capable of performing comprehensive electrical tests on a variety of semiconductor, RF, and digital devices. The unit is especially suitable for the high-volume final test of CAMs (Computer-aided Manufacturing) and any other type of IC device requiring final test prior to shipment. ADVANTEST T5335P makes use of a high-speed, parallel-processing architecture and includes a host controller, a set of card racks, tester module, and global control and monitor. The machine also includes a selection of user-programmable multi-hardware and software test functions. T 5335 P offers a wide range of test capabilities, including logic tests, analog/digital measurements, and fault detection. The tool utilizes a unique MemoryFlex controller that allows it to rapidly adapt to complex test requirements. The MemoryFlex controller also detects test faults before executing the test sequence, so that tests can be interrupted in case of errors. The asset features eight test sites (six instrumented test sites and two general test sites) and can be configured with a variety of specialized features. These features include digital stimulus, electronic calibration, crosstalk detection capability, and supply and speed optimization. The model is also able to run a variety of test utilities, such as logic noise analysis, node scan analysis, and pattern combining. In addition, ADVANTEST T 5335 P includes a global control and monitor, which displays test results and analysis data on its large colour display. The equipment also features report generation, automatic data logging, and real-time interface to databases. T 5335P Final Test System is ideal for high-volume testing of CAMs and other IC devices. Its high-speed, parallel-processing capabilities, flexible test features, and comprehensive reporting capabilities make it an optimal choice for semiconductor, RF, and digital device testing applications.