Used ADVANTEST T 5335P #9311759 for sale

ADVANTEST T 5335P is a leading-edge final test platform designed to provide high-quality, cost-effective test and measurement solutions for semiconductor devices. ADVANTEST T5335P utilizes a modular architecture and a suite of software and hardware solutions to provide comprehensive testing and evaluation services for a wide range of semiconductor products. With the help of dedicated test equipment and powerful test software, T 5335 P is capable of testing existing and emerging semiconductor technologies, making it an ideal solution for production test and reliability testing. T 5335P utilizes a CTT-8300 test cell, which supports up to 2,000 test pins and drives up to 4,500 tests per second. This test cell also provides a number of features such as automatic device probing, 34-pin floating active probes, and a temperature range of -30°C to +125 °C. Additionally, T5335P includes a number of integrated test resources such as signal generators, digital volt meters, power supplies, and parametric measurements. ADVANTEST T 5335 P is designed with an open-architecture, supporting the integration of custom and third-party test software and hardware solutions. This software-defined test solution enables the use of a wide range of test algorithms, including time and frequency domain measurement, current path and leakage test, switching waveform measurement, noise analysis. ADVANTEST T 5335P is designed to be user-friendly and intuitive for operators and test engineers. It includes built-in functions such as data loggers for recording test results, an SD card slot, programmable timer, and a recipe editor. It also provides a web-based graphical user interface, which allows test engineers to easily create their own test programs and setup. In order to ensure the reliability of test results, ADVANTEST T5335P utilizes a real-time monitoring system to detect errors and identify sources of test failure. This system checks and corrects any errors in the test environment, including test fixtures and test software, and can detect environmental parameters such as temperature and humidity. T 5335 P is a reliable, cost-effective test and measurement solution for production test and reliability testing of semiconductor devices. Its powerful test cell, opened architecture, and intuitive user interface provide a comprehensive solution for final test applications.