Used ADVANTEST T 5376 #293665893 for sale

ADVANTEST T 5376 is a highly advanced, full-function final test equipment designed specifically for the testing and measurement of an array of semiconductor devices. Employing a wide range of interfaces and integration options, ADVANTEST T5376 test system is easy to configure and operate for a variety of semiconductor device test and measurement needs. T 5376 test unit utilizes a high-volume, configurable probing unit for efficient and repeatable wafer probing. This advanced testing unit is equipped with two types of probe cards for comprehensive measurements. It offers automated control of probes, a wide range of probing modes, and high-speed testing capabilities. The machine is also equipped with a unique active tip biasing feature to ensure highly precise test results. T5376 is equipped with a high-performance signal integrity assessment chamber. This chamber is capable of measuring a wide range of test parameters with high accuracy and sensitivity. The tool also features an industry-leading scanning electrode microprobe that can perform destructive inspection operations to ensure high reliability in test and measurement results. ADVANTEST T 5376 is powered by the latest-generation semiconductor test platform. This platform provides advanced test and measurement features, including multiple language support, wide-bandwidth data capture capabilities, integration with multiple device test software applications, and advanced process control features. The asset is packaged with a range of fully integrated software solutions, including a data acquisition and modeling package to support linear and model-level analysis. It also supports an industry-standard high-speed link for quick and easy communication between test management systems. Additionally, ADVANTEST T5376 test equipment is also supported by comprehensive and customizable documentation packages to ensure adequate and consistent end-user support services. Overall, T 5376 is a powerful and feature-rich final test system designed for comprehensive testing and measurement of a wide range of semiconductor devices. The unit is highly configurable and provides an integrated suite of software solutions, industry-leading test and measurement functionality, and robust process control capabilities. T5376 is an ideal solution for efficient and reliable semiconductor test and measurement in a wide variety of design environments.