Used FEI Expida 1255S #9228103 for sale

FEI Expida 1255S
Manufacturer
FEI
Model
Expida 1255S
ID: 9228103
Wafer Size: 12"
Dual beam FIB system, 12" Manual load No stem NGSEM COL.
FEI Expida 1255S is an ion milling equipment that uses ion beam technology for thinning, shaping, milling, and further surface modification of a variety of materials. It features a 5-axis tilting stage with ultra-high accuracy motions for precision machining of samples. The sample holder accommodates a large variety of specimen sizes with direct heating and cooling capabilities. The control system of Expida 1255S utilizes a combination of low voltage scanning electron microscope (LV SEM), mass spectrometry (MS), Auger electron spectroscopy (AES), and ion scattering spectroscopy (ISS). LV SEM works by projecting electrons at the sample in order to form a signal that is used to construct an image. MS is used to determine the mass, energy, and composition of particles on the sample. AES is used to analyze the composition of the surface of the sample. ISS is used to generate images and determine elemental concentration on the surface of the sample. FEI Expida 1255S includes a powerful ion beam for improved sputtering power, with a 500 V range and up to 10kV acceleration voltage at <10 mA beam current. The precise control of the ion beam allows for accurate milling and needs only minimal over milling, which helps preserve the integrity of the sample. The beam's stigmator optics and beam generator also ensure precise beam control to obtain the desired surface results. To ensure safety, Expida 1255S features several built-in safety features. These include an airtight enclosure, a direct current (DC) bias pipe, and a sealed laser chamber. The DC bias pipe minimizes the risk of ion contamination of the sample or the unit. The laser chamber prevents the escape of harmful laser beams from the machine. Overall, FEI Expida 1255S is an excellent ion milling tool for thinning, shaping, milling, and surface modification of a variety of materials. Its precise control of the ion beam helps preserve the integrity of the sample, while its built-in safety features ensure maximum safety. This makes Expida 1255S a dependable choice for any thin film analytical task.
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