Used FEI Expida 1265 #9314991 for sale

Manufacturer
FEI
Model
Expida 1265
ID: 9314991
Wafer Size: 12"
Dual beam Focused Ion Beam (FIB) system, 12" TEM lamella preparation SEM Resolution: 5-7 nm Defect analysis: >70 nm FOUP Load port, 12" Flexi lock for single: 8"-12" Ion beam for FIB cut or deposition Sample holder included OXFORD Xmax EDX Detector: 50 mm² Insulator Platinum gas injection system OMNIPROBE Autoprobe 200 Micromanipulator EDWARDS iQDP40 Primary pump NESLAB HX+75 Water chiller ONEAC Power transformer THOSHIBA 1400XL Plus UPS FEI Navigator 7.3 to load klarfs FEI Annotation Digital control through Windows Upper and lower chamber included Robot faulty part.
FEI Expida 1265 is an advanced ion milling equipment designed for the processing of materials at their nanometer level. It enables the analysis and modification of the mechanical, electrical and chemical properties of materials from a wide variety of materials such as semiconductors, metals, polymers and composites. Expida 1265 is a multi-functional ion milling system that is equipped with a broad range of ion beam sources and control capabilities. It allows the user to mill, smooth or etch layers or matrixes from a wide range of materials for a variety of applications. The source of the ions can be controlled and the power of the ion beam can be regulated and adjusted to vary the speed of milling. The unit is equipped with a cryo-sem cooling machine to extend the lifetime of samples and protect delicate materials. This cooling tool is designed to keep the samples at the right temperature while maintaining a stable process environment. The sample holder allows for easy handling and placement of samples. It can be used with a wide variety of sample types and sizes and enables highly accurate milling and etching processes. FEI Expida 1265 has an integrated 3D motion controller, which enables reliable and accurate scanning of the samples during the process. This motion controller can be set up to mill and etch specific two- and three-dimensional patterns. The ion beam current is adjustable and can range from DC to AC, making it easier to fine tune the beam current and milling rate for precise results. Expida 1265 also features an advanced superconducting ion source, which can extend the lifetime of the sample by easing the ion bombardment process. Additionally, the asset has advanced image acquisition and analysis capabilities, which allow users to analyze and monitor the progress of their processes and make informed decisions. The model also supports networking and remote access, making it easy to monitor processes from different locations. FEI Expida 1265 is an extremely versatile and reliable ion milling equipment, capable of serving a wide range of precise milling and etching needs. It is an ideal choice for researchers and manufacturers who require an advanced ion milling system capable of producing high quality results.
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