Used INTEK PLUS IPIS-300 #9148604 for sale

INTEK PLUS IPIS-300
ID: 9148604
Vintage: 2010
Inspection system 2010 vintage.
INTEK PLUS IPIS-300 Mask and Wafer Inspection Equipment is an advanced tool for semiconductor manufacturing processes. It provides a high-speed, high-resolution platform for inspecting mask and wafer products during the fabrication process. The system is fully automated, and uses an array of CCD cameras to inspect masks, wafers, and dies quickly and accurately. IPIS-300 offers a 1.2 Megapixel CCD camera array that captures images with better than 5 micron per story accuracy. This high resolution enables the unit to evaluate sub-patterns, allowing it to detect even the smallest defects that may otherwise go unnoticed. The machine also features a 5-axis metrology drive that can rotate and capture along three angles and move in the horizontal and vertical alignments, which provides an even more in-depth analysis of the masks and wafer products. INTEK PLUS IPIS-300 offers a variety of inspection features and capabilities including spot and line inspections, minimum feature detection, and defect review. The tool's noise reduction algorithms can help to identify false alarms and reduce noise from the wafer or mask product. Additionally, the asset can evaluate wafers' critical parameters, such as focus, chart, and overlap. IPIS-300 also provides a dedicated software suite that streamlines the wafer and mask inspection process. The software allows users to quickly set up the model, capture images, and generate detailed reports. It also offers a host of analysis options, including defect classification, sizing, and coverage, as well as the ability to save parameter settings for later work. Overall, INTEK PLUS IPIS-300 is an advanced equipment that provides high-resolution, automated inspection of mask and wafer products. With its 1.2 Megapixel CCD camera array, high-resolution imaging, noise reduction algorithms, and dedicated software suite, the system is capable of detecting even the smallest of defects, allowing users to inspect wafer and mask products with greater accuracy and speed.
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