Used JONAS & REDMANN 5001002261 #9289500 for sale

JONAS & REDMANN 5001002261
ID: 9289500
Vintage: 2016
Systems 2016 vintage.
JONAS & REDMANN 5001002261 mask & wafer inspection equipment is a highly accurate and precise system for the detection of defects in semiconductor-level circuits. This is a fully automated unit which can detect both large and small defects on the masks and wafers. The machine is equipped with an array of optical sensors that are capable of identifying non-visible defects such as scratches on the masks, voids on wafers and contamination layers that may cause electrical shorts. The high resolution of the tool provides an excellent detection capability even in the most complex designs. It can also detect defects that are only visible under extreme magnification. The asset is equipped with a high-speed data acquisition model that can measure up to 1000 points per second providing a great degree of accuracy and speed for defect detection. This equipment can accurately measure the thickness and width of the wires used in the circuits, and also the dielectric constant of the wafer. These features make it especially effective for analyzing and detecting problems in high-density devices such as multi-layer wiring and 3-D packaging. In addition to its detection capabilities, 5001002261 mask & wafer inspection system also has an advanced image analysis unit that can identify, analyze and classify the various defects that it finds. This includes the identifying of defects in the masks, wafers, packages and wire design, and also the analysis of the surface topography of the wafer. This machine allows for greater accuracy and reliability of inspection results. JONAS & REDMANN 5001002261 mask & wafer inspection tool is an advanced and powerful asset that can help ensure that only circuits with top-notch quality are used in semiconductor manufacturing. It is designed to be used with a range of other inspection systems and technologies, such as 3-D imaging and laser scanning to ensure that defects are detected and prevented from causing any serious failures in the semiconductor devices that are used in the final products.
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