Used KURODA Nanometro #196389 for sale

ID: 196389
Wafer Size: 12"
Wafer inspection systems, 12" Cap-gage.
KURODA Nanometro is the next generation of mask and wafer inspection systems, specifically designed to quickly and accurately measure and analyze nanoscale structures with convenience. The equipment is able to automatically inspect with high resolution of up to 10nm while still being able to measure larger structures and defects. It is configurable and includes a patented data-processing algorithm that allows for the detection and characterization of nanoscale defects with high precision. With Nanometro, both structure and defect characterization can be completed in short times. The key features of KURODA Nanometro include the high accuracy and speed. High accuracy measurements are enabled by the high speed dual-pixel technology. This combined with advanced algorithms allows for quick detection of subtle defects even at higher magnifications. The inspection system offers multiple scanning modes to accommodate the different sizes and types of objects. The user-friendly user interface offers easy control of imaging parameters such as scanning frequency and scanning pattern. The unit also includes a software package with live image manipulation and image analysis tools. This allows users to quickly parameterize the machine and enable precise representation of the data. Nanometro is compact and lightweight and easy to integrate into existing testing setups. Its built-in defect library ensures repeatability, limiting the time required to look for defects. The defect library allows users to save, review and export data to a central archive for future reference. Furthermore, the tool is low-noise, eliminating the need for noise reduction systems or any additional hardware, reducing overall costs. Overall, KURODA Nanometro is an ideal choice for projects where speed and precision are of the utmost importance. With its exceptional user-friendliness and ease of integration, advanced imaging capabilities, and its defect library, Nanometro is no doubt a great asset for inspecting nanoscale features.
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