Used NANOMETRICS 210 XP #9185099 for sale

NANOMETRICS 210 XP
ID: 9185099
Film thickness measurement system.
NANOMETRICS 210 XP is a high-performance, automated mask and wafer inspection equipment that enables both manual and automated defect review and the rapid classification of defects. It offers an effective and efficient solution to help identify potential yield-limiting defects caused by process variations. NANOMETRICS 210XP combines automated defect recognition with image analytics to quickly identify, analyze, and classify defects that can significantly reduce the cycle time for mask and wafer yields. Its proprietary image recognition software, high-resolution imaging system, and comprehensive inspection rules provide critical data for fast and accurate defect identification. 210 XP combines a powerful suite of software tools including defect tracking, image analytics, and diagnosis. Its automated defect recognition process is designed to quickly identify potential yield-limiting defects and classify them according to type, size, and shape. The software also provides operators with detailed information about the mask and wafer layout and provides a comprehensive summary of all defects in the mask or wafer. The unit's optical machine also features a high-performance Abbe confocal profile detector that offers users submicron-level resolution, as well as a wafer compensation stage and a field of view that enables users to view the entire wafer simultaneously. It offers users flexible imaging modes that allow inspection of various structures such as die, selvedge, bumps, and pinholes. 210XP provides users with exceptional control and flexibility over their inspection process. Its adjustable image review parameters allow operators to easily set the tool to their specific requirements, and the asset's user-friendly interface simplifies the data review process. NANOMETRICS 210 XP is ideal for semiconductor manufacturers and research/development facilities requiring automated defect detection and classification. It offers a reliable, efficient inspection and defect management solution for industries seeking higher inspection and yield rates.
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