Used OSI Metra 2115M #293629181 for sale

ID: 293629181
Vintage: 1996
Overlay measurement system 1996 vintage.
OSI Metra 2115M is an advanced-level mask and wafer inspection equipment designed to be used in the manufacturing process of semiconductors. It utilizes an advanced automated image recognition technology to quickly and accurately inspect the surface of a mask or wafer for defects or irregularities that could affect product quality. Its main components include a scan stage with built-in precision X/Y and tilt movements, a vacuum-based vision system, and a high-resolution LCD image monitor. The vision unit utilizes a variety of optics, including digital cameras, microlenses, and wavelength-sensitive sensors to rapidly capture, analyze, and display high-resolution images of the surface of the mask or wafer. The data recorded is then used to detect subtle irregularities in the surface such as particle contamination, cracking or warping, or other irregularities that could lead to defective or sub-standard semiconductor components. Metra 2115M also includes a user-friendly interface for programming and process control. The machine is capable of performing complex tasks such as tracking non-uniform steps, controlling waveforms, and controlling the X/Y and tilt movements. The programmable logic controller allows the user to customize the parameters of the inspection and the data analysis process. In addition, OSI Metra 2115M features a specialized, large-format statistical analysis software that allows for rapid and consistent analysis of large amounts of data. This software can compare data gathered by the vision tool across many wafer or mask surfaces to quickly identify outliers or abnormalities. Finally, Metra 2115M is designed for easy integration into other processes and equipment. Its network interface allows for connection with other machines, such as laser scanners or automated sorting systems, without any difficulty. This allows it to be incorporated into other processes as needed to streamline the production process of semiconductors.
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