Used SEMILAB WT-2000PV #293603834 for sale

SEMILAB WT-2000PV is a mask and wafer inspection system designed for wafer and mask inspection in semiconductor production. It has the capacity to detect and diagnose defects at a sub-nanometer resolution and provides a wide range of defect measurements. SEMILAB WT 2000 PV stands out among other mask and wafer inspection systems due to its high-resolution, precision, and accuracy. It utilizes a proprietary lens design to create a large field of view while maintaining highest-quality imaging. The in-line optics are capable of obtaining photos of very small feature sizes on mask as well as wafers. The system is equipped with a high-end X-ray detector that provides high sensitivity and enables high-resolution imaging. The X-ray detector also allows for a large measurement range and high sensitivity for defect detection on masks and wafers. WT-2000PV is equipped with advanced imaging, measuring and analytical features. Imaging features include a custom-designed color camera and back-illuminated slitlite imaging which allows visual inspection of wafer surface features. Measurement features include automated and semi-automated stitching and true cross-section imaging to 2.5nm and below. Analytical features include 3D optical measurement of wafer roughness, patterning, and mask defects. WT 2000 PV also features advanced software features to freely choose observation modes. This allows users to freely choose observation modes such as amplitude, phase, power, and minimum/maximum focus, as well as parameter editing for the enhancement of inspection results. In summary, SEMILAB WT-2000PV is a mask and wafer inspection system that is highly accurate and precise, with the capacity to detect even the smallest defects. It is equipped with advanced imaging, measuring, and analytical features that enable its users to choose observation modes freely and edit parameters for optimal inspection.