Used YASUNAGA C 200 #133035 for sale

YASUNAGA C 200 is a fully automated mask and wafer inspection equipment. It utilizes advanced computer vision technology to detect the presence of defects and process them for easier assessment. The system is designed for use in silicon wafer production processes, and can be used for both regular in-process quality control and for failure analysis. The unit employs a hyperspectral imaging machine to detect subtle defects that cannot be seen using other inspection mechanisms. The highly sensitive detection capabilities allow for a wide range of defect types to be quickly and accurately identified. The tool also offers a comprehensive set of inspection features and analysis tools that allow for comprehensive defect analysis. The asset works by combining several cutting-edge technologies to create a comprehensive model. First, C 200 utilizes cutting-edge optics, including polarized and non-polarized lighting, to maximize the accuracy and range of defect detection. It also utilizes advanced algorithm software to interpret the acquired images. This helps ensure their accuracy and completeness. Finally, the equipment uses image registration techniques to ensure that the images will be accurately detected at any orientation and without interference from the surrounding environment. In addition to its detection capabilities, YASUNAGA C 200 is also capable of performing detailed defect analysis. It can detect both common and complex defects, providing detailed information about the defect's size, type, location, and other characteristics. This can provide invaluable insights when identifying potential process issues. Additionally, the system also features a series of statistical analysis tools that can be used to analyze the frequency and distribution of the detected defects. C 200 is an ergonomic, highly intuitive unit that is easy to integrate and use within a production process. It is available in both portable and stationary form, allowing it to be used in both on-site and remote locations. Additionally, it is maintained with a minimal amount of effort and requires minimal operator training. YASUNAGA C 200 is an advanced mask and wafer inspection machine that can help organizations ensure the highest quality and reduce defects from their production processes. It provides a highly-sensitive and reliable defect detection tool, making it an invaluable tool for quality assurance and production optimization.