Used YEST YIH-2400 #9098824 for sale

YEST YIH-2400
ID: 9098824
Mask repair system.
YEST YIH-2400 Mask and Wafer Inspection Equipment is an advanced imaging system designed for the detection and identification of defects in wafer substrates and masks used in the manufacture of semiconductor circuits. The industrial imaging unit is optimized for semiconductor applications, featuring a high-speed, 12-megapixel image sensor and proprietary micro lens arrays to produce high-resolution images. The machine is also equipped with an on-board computer that supports a variety of machine vision and image inspection algorithms, as well as advanced color coding and further image analysis features. The tool enables a wide variety of detection functions through its built-in algorithms. Examples include defect detection, geometry detection, process monitoring, feature finding, and binning. Users can also define custom detection steps and apply algorithms to individual defects. YIH-2400 Mask and Wafer Inspection Asset features a reliable, high-efficiency laser-based illumination model, which enables precision alignment of wafers and masks to the imaging equipment. Furthermore, the system is designed with a multi-axis loading unit for easy loading and unloading of wafers and masks, along with a sophisticated wafer handling machine for additional accuracy. The tool also provides a variety of data output options, such as error maps, histograms, and pass/fail criteria reports, to monitor the health of the wafer and mask products, as well as to inspect parts for any process issues. All of these capabilities enable manufacturers in the semiconductor industry to correctly and efficiently screen out defective wafers and masks, reducing production interruptions and increasing yields. Ultimately, YEST YIH-2400 Mask and Wafer Inspection Asset is an advanced imaging model designed to detect and identify defects in wafer substrates and masks used in the manufacture of semiconductor circuits. This equipment has been designed with the most sophisticated image inspection algorithm tools and a reliable laser-based illumination system, allowing for error-free production and quality assurance in the semiconductor industry.
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