Used YEST YIH-2610 #9098825 for sale

YEST YIH-2610
ID: 9098825
Vintage: 2008
Mask repair system, 2008 vintage.
YEST YIH-2610 Mask and Wafer Inspection Equipment is a versatile solution for both mask and wafer inspection. This system provides high-resolution imaging capabilities, as well as automated mask and wafer defect detection for 12" wafers. YIH-2610 features a 5-megapixel progressive scan CCD line scanner and an integrated 88-element LED light source, enabling it to detect and identify defects up to 0.7 μm in size. Its expanded field of view and large depth of field eliminates the need for manual focus adjustments. YEST YIH-2610 also offers an integrated software package for mask data preparation, manual mask editing, mask inspection, defect review, and post-processing. YIH-2610 offers a simple operator interface, as well as a Graphical User Interface (GUI) for complete automation of inspection jobs. The unit can be configured to meet the requirements of various inspection applications, with adjustable scan range, scan speed, exposure time, and resolution. The machine features an ergonomic design and robust construction, with minimal moving parts and a vibration-damping framework to provide stability and image accuracy. YEST YIH-2610 utilizes advanced defect characterization algorithms to detect and identify both brightfield and darkfield defects, including open/short circuits, die-line defects, scratching, and voids. It provides real-time, interactive preview of inspection results, along with a comprehensive statistical analysis of results, allowing for improved process control. The tool also features a range of data exporting options, including but not limited to TIFF and BMP format images. YIH-2610 asset is highly reliable and easy to maintain. Its design meets high EMI/EMC levels and vibration category requirements for optimal safety and reliability. The model can be used in cleanrooms up to class 10 (according to ISO-14644-1) for minimal downtime and maximum productivity. It can also be equipped with a range of peripherals, such as peripheral illumination, sample and/or workstage, or other customized configurations.
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