Used SONOSCAN AW-312 #9352121 for sale

SONOSCAN AW-312
Manufacturer
SONOSCAN
Model
AW-312
ID: 9352121
Vintage: 2012
System 2012 vintage.
SONOSCAN AW-312 is a beam-scanning acoustic microscope with a 5-inch imaging area that offers precision acoustic imaging in a variety of applications. It has a 20 MHz bandwidth and a wide range of acoustic lenses, acoustic sensors, and transducers for acquiring top-quality images. This platform offers high resolution and accuracy making it ideal for a variety of applications, such as surface topography, semiconductor process analysis, and nano-structure imaging. AW-312 is a compact and lightweight equipment, equipped with an intuitive graphical user interface for ease of use. The excellent sensitivity and high-accuracy imaging of SONOSCAN AW-312 makes it suitable for measuring various surface characteristics, including surface roughness, surface defects, and other features. Furthermore, it enables precise quantification of three-dimensional structures thanks to its high lateral resolution and fast imaging speed. The system is capable of detecting and determining defect characteristics with precision and accuracy. It is also able to identify changes in surface topography and analyze defects such as pits, scratches, and voids. The unit is also capable of automatically creating and optimizing its imaging parameters for optimal results. AW-312 is equipped with an intuitive software interface, which provides users with a number of advanced features such as automatic calibration, image capture, real-time viewing, and more. Additionally, the machine can be configured with a variety of transducers such as focused and unfocused probes, and an array of lenses to adjust the size and shape of the imaging area. SONOSCAN AW-312 offers a high degree of precision and accuracy for imaging microscopic and nanoscopic structures. Its wide range of acoustic lenses, acoustic sensors, and transducers makes it an ideal platform for a variety of research and industrial applications. It is suitable for measuring various surface characteristics, including surface roughness, surface defects, and out-of-focus features. In addition, this platform is capable of automatically creating and optimizing its imaging parameters for optimal results.
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