Used SONOSCAN FACTS2 #9214388 for sale

SONOSCAN FACTS2
Manufacturer
SONOSCAN
Model
FACTS2
ID: 9214388
Fast automated C-SAM tray scanning system.
SONOSCAN FACTS2 is a high resolution acoustic microscope that combines the power of laser vibrometry and acoustic microscopy technologies in one single microscope system. It is designed for advanced precision imaging and measurement applications in the semiconductor, automotive, medical, electronics, aerospace and other industrial manufacturing sectors. It uses a laser Doppler vibrometer to detect acoustic waves and then interprets them to show off nano-structures that are hard to find with a traditional optical microscope. SONOSCAN FACTS 2 has a frequency range of 100 kHz to 5 MHz and up to 15 micron spatial resolution. It has a wide range of transducers from broad beam low frequency 0.5 to 10 MHz to angle beam MSOT and VFM probes designed specifically for imaging and advanced material characterization. With the advanced imaging and characterization, FACTS2 also offers a wide range of automated measurements such as transducer calibration, defect characterization, kinetic measurements, damage analysis, acoustic microscopy measurements and more. FACTS 2 utilizes a patented laser vibrometer heterodyne principle for improved resolution and low noise signal. An on-board vibration waveform fitting software allows for automated characterization of acoustic and vibration waves. It has unique features such as full edge detection, process optimization and measurement automation. Additionally, SONOSCAN FACTS2 allows for extended runtime with 3 field serviceable replaceable batteries, potentially capable of running 1 to 2 weeks on a single set of rechargeables. Specifically designed for nanoscale, highly dynamic imaging and scanning, SONOSCAN FACTS 2 is modular and fully integrated into the industrial research, design and manufacturing environment. Its fast real time imaging characteristic enables imaging of thousands to millions of pixels combined with dynamic wave correction and distortion correction with proper edge detection. It has precise control and geo-referencing supporting both in-situ and off-line measurement analysis. Overall, FACTS2 is a versatile, precise and flexible microscope used for a wide range of nano- to macro-scale imaging and measurement applications in various industrial and research fields. Its ability to probe and measure nano-structures and surfaces at unprecedented resolutions enables it to provide valuable information that can be used to optimize product development and yield in industries such as semiconductors, automotive, medical, electronics and aerospace.
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