Used VEECO / BRUKER DiInnova #9398521 for sale

Manufacturer
VEECO / BRUKER
Model
DiInnova
ID: 9398521
Atomic Force Microscope (AFM) Sample holder piezo non-functional.
VEECO / BRUKER DiInnova microscope is an advanced, high performance field emission scanning electron microscope (FE-SEM). This state of the art instrument is designed for maximum resolution imaging, easy automated operation and low sample damage. VEECO DiInnova utilizes an innovative channel electron multiplier detector equipment that is capable of producing consistent high quality results, even with challenging samples. It also implements a proprietary magnetron gun that allows for accelerated resource availability and lower cost of ownership for the user. BRUKER DiInnova provides users with a resolution of up to 1 nm, which is more than enough to resolve the finest details of any sample. Additionally, the industry-leading low operating temperature ensures that samples are not damaged during operation. This makes DiInnova an ideal tool for applications such as thin-film characterization, failure analysis and microstructural imaging. The microscope is also equipped with auto-focusing and a large working distance to ensure the highest image quality. The electron optics employed within VEECO / BRUKER DiInnova ensure higher performance and durability over traditional optical systems, leading to improved image fidelity. Additionally, the instrument provides an extensive range of features such as automated sample navigation, advanced imaging modes and dedicated software to streamline sample analysis. The automated navigation system allows the user to easily calibrate the field of view and traverse large volumes quickly and accurately. The integrated imaging unit also supports multiple imaging modes including secondary electron imaging (SEI), back scattered electron imaging (BSE), decelerated electron imaging (DEI), and energy dispersive x-ray imaging (EDXI). These imaging modes can be used in conjunction with each other to obtain unprecedented detail from a single sample. Finally, dedicated software packages have been designed to optimise sample navigation and image manipulation within a user-friendly and intuitive environment, making VEECO DiInnova suitable for a range of imaging and analysis needs. All in all, BRUKER DiInnova is an advanced, high performance field emission scanning electron microscope that is designed to facilitate quick and easy samples analysis while delivering state of the art results with minimum damage to the samples. With its extensive range of features, dedicated software and integrated imaging machine, DiInnova is a powerful and valuable tool for a range of applications.
There are no reviews yet