Used VEECO / DEKTAK Dimension X3D #9203396 for sale

ID: 9203396
Wafer Size: 12"
Vintage: 2006
Atomic Force Microscope (AFM), 12" 2006 vintage.
VEECO/Depak VEECO / DEKTAK Dimension X3D is a state of the art scanning micro-probe microscope designed to measure and analyze materials at the nanometer level. This microscope utilizes a combination of atomic force and scanning tunneling microscopes to provide ultra-high resolution imaging, real-time imaging, and fast data analysis. The instrument is capable of performing advanced surface analysis and material characterization, giving researchers the ability to analyze a wide range of materials that are hard to measure. VEECO Dimension X3D is an invaluable tool for research and development in semiconductor fabrication process development, material science, life science, and engineering. It is primarily used to measure surface steps, voids, grain boundaries, defects at the nanoscale, and structural features of a variety of materials. It can even be used to analyze nanoscale roughness measurement, measuring particles of nanosize. DEKTAK Dimension X3D can measure a wide variety of materials such as inorganic, organic, and polymers. This instrument also has a wide range of application such as imaging high-angle tilt images of curved surfaces, determining surface roughness, measuring nano-threads of polymers, and studying the details of nanostructures. The main feature of Dimension X3D microscope is its high accuracy and quality imaging capability. The microscope is equipped with a very fine XYZ positioning system to acquire high-precision images of nanostructures. This system is able to acquire high-resolution images in the angle of tilt as low as 0.1 degrees. Furthermore, the high resolution is maintained throughout the entire range of the measurement.To ensure the highest accuracy of results, the instrument also has a closed loop triggering system and an anti-vibration function. In addition to its excellent imaging capabilities, VEECO / DEKTAK Dimension X3D also provides powerful analysis tools. It is able to measure dimensional parameters with high-precision, such as surface step heights, trench depth, surface roughness, etc. This allows researchers to not only obtain detailed images of a material, but also be able to make quantitative measurements to give more insight into their research. The Dimensions X3D is a cutting-edge instrument that provides top-of-the line features. Its high-resolution imaging, accurate analysis and advanced features make it an invaluable tool in any laboratory. This makes it an ideal choice for any organization that needs to characterize materials at the nanometer level.
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