Used VEECO / DEKTAK Dimension X3D #9285850 for sale

VEECO / DEKTAK Dimension X3D
ID: 9285850
Wafer Size: 12"
Atomic Force Microscope (AFM), 12".
VEECO/DEKTAK3 VEECO / DEKTAK Dimension X3D is a state-of-the-art 3D surface measurement/profilometry tool designed for the nanoscale metrology and characterization of various materials. It is built on the latest optical, mechanical, and automation technologies providing precise and cost-effective data acquisition capabilities. The X3D features a unique optical design, encompassing a compact XY piezo stage, high-resolution CCD camera, laser-based depth sensors, and advanced color optics. The integrated software platform offers an intuitive user interface and powerful data analysis tools, including real-time 3D surface data visualization, statistical analysis, and automated report generation. The X3D utilizes optical profilometry technology to precisely measure the surface shape and roughness of objects across all three dimensions. The tool uses a laser line projected onto the surface of the sample and a complementary camera to capture the contours and height variations of the sample with an accuracy down to the nanometer scale. The laser sources used in the X3D are adjustable to deliver high-resolution and fast acquisition capabilities, and the system utilizes multiple lasers to improve stability and accuracy. The X3D is capable of measuring micro- and nanoscale structures, accurately capturing angular, curved, and sheer features. The X3D provides robust and precise alignment and control, with its motorized sub-IMG platform, allowing for accurate surface measurements with speed and repeatability. The enhanced optics allow for better data acquisition capabilities and improved resolution, and its high-speed imaging camera system provides real-time feedback and quick image capture. The 3D data generated by the instrument is compatible with a variety of data analysis tools, including 3D CAD-imaging and surface analysis software. VEECO Dimension X3D is an ideal tool for characterizing a broad range of materials, from semiconductor and bio materials to new age polymers, ceramics, and composites. It offers an exceptional combination of accuracy, resolution, speed, and dynamic range, making it an invaluable measurement and characterization tool for industrial and research applications. The X3D has proven to be a powerful and reliable metrology solution to obtain nanoscale surface information with unparalleled accuracy and precision.
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