Used VEECO / DEKTAK Dimension X3D #9390606 for sale

VEECO / DEKTAK Dimension X3D
ID: 9390606
Atomic Force Microscopes (AFM).
VEECO / DEKTAK Dimension X3D, is a high-performance vertical scanning microscope designed for use in a broad range of metrology and microscopy applications. The X3D employs an integrated vision equipment that utilizes a high-resolution, 2048 x 2048 image sensor for top-down viewing of the sample. The X3D is one of the most accurate and repeatable vertical scanning microscopes available, with a possible resolution of 1 nm along the z-axis, and up to 0.1 um for x- and y-axis measurements. The X3D provides excellent repeatability for measured data. The X3D includes a variety of features that ensure high-accuracy, repeatable measurements. The X3D utilizes a raster-patterned illumination system, which provides an even intensity across the sample area. This provides uniform illumination, which enhances accuracy when scanning and measuring height. The X3D also includes a powerful image processing unit with up to 32x magnification, which allows for detailed sample imaging. The machine is capable of bright field, dark field, and fluorescence imaging, as well as automated on-the-fly measurement calculations. The X3D includes a variety of operational modes, including scan, map, tilt, and height. These allow the user to generate topographical maps, calibrate and verify measurements, and perform advanced metrology applications. The scan mode allows the user to generate 2D scans, while the map mode automatically generates high-resolution 3D topographical maps with positional accuracy of up to 0.15 microns. The tilt mode performs projective 3D surface topographical measurements on samples with angles of up to 70°, allowing users to analyze surface roughness and non-planar profiles. The height mode measure absolute height with a position accuracy of up to 0.3 microns. One of the most popular features of the X3D is the Metrology Package software, which automates the entire measurement process from calibration to data acquisition. This feature reduces critical operator error and increases overall accuracy and throughput of measurements. The X3D also features a large stage area, with optional motorized stage XY drives offering ranges of up to 150 mm. This feature provides a large workspace for a range of applications, from material research to device engineering. The X3D is the ideal microscope for researchers and engineers looking for a reliable, repeatable measuring tool. Its powerful imaging capabilities and measurement functionality make it well suited for a variety of applications. From routine non-contact scanning to ultra-precise high resolution measuring, the X3D is the perfect tool to get the job done.
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