Used VEECO / DEKTAK Dimension X3D #9396852 for sale

ID: 9396852
Vintage: 2005
Atomic Force Microscopes (AFM) 2005 vintage.
VEECO / DEKTAK Dimension X3D is an advanced optical microscope designed for precise and detailed 3-D surface topography measurements. It is capable of producing nanometer-scale surface mapping with a footprint that is five times smaller than traditional non-contact/touch-free profilometers. The X3D utilizes a contact-free, non-destructive vertical scanning interferometer (VSI) technique for 3-D measurements. The equipment works by projecting an infrared laser beam onto the surface in a dual-pass manner and captures the interference between the sample and the reference beam, which is used to calculate the overall profile of the sample. The X3D features an improved interferometer-based system with enhanced data acquisition and analysis capabilities. It uses multiple air bearing stages for high performance tip-tilt correction for scanning over curved surfaces. This allows for accurate surface measurement of both flat and curved samples. The X3D's microscope measurement head is highly tolerant to vibrations, offers very low noise levels, and has excellent power handling capabilities. It also features a proprietary vibration-dampening structure for stabilization of the scanhead with physical feedback on the scanhead. The unit has a built-in thermal compensation machine for controlling temperature-induced drift in the measurements. This ensures that the data is evenly distributed and is accurately represented on the surface. The X3D also features a powerful, sophisticated software package to control the microscope and analyze the captured images. The software can provide a number of applications including surface roughness and contour characterization, texture analysis, 3-D profile mapping, and peak/valley measurements. The X3D is an ideal solution for high-precision surface metrology and micro-surface inspection. It has been designed for both industrial and academic scientists and provides reliable results with a high degree of precision. It offers an affordable and easy to use solution for detailed 3-D mapping of surfaces.
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