Used VEECO / DIGITAL INSTRUMENTS Dimension 3100 #9160895 for sale
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ID: 9160895
Atomic Force Microscope (AFM)
Maximum sample size: 8” Diameter, 0.5” thick
Inspection area: 100 x 125 mm
Small samples: Magnetic holder < 15 mm diameter
Silicon wafers: 2”-8"
AFM Probe station with shockproof pressure balance system
Video zoom microscope
Integrated zoom optical microscope
Objective: 10x (Long working distance)
(2) TV Camera tubes
Motorized zoom system
Motorized focus
Lens illumination
Color video camera
Focus tracking and automated engagement
Magnification range:
410-1845x With 13” monitor
Field of view: 180-810 µm
Cantilever holder
Standard:
Tapping mode
Contact AFM, MFM
Fluid cell:
Fluid contact AFM
Fluid tapping mode
Parts includes:
AFM Probe station
D3100-1 AFM Probe and test bench
D3100HP-2 AFM NanoScope Dimension 3100 controller
NanoScope IV AFM Scanning probe microscope controller
AFM Control personal computer system:
ViewSonic VE 700 Dual screen system
PC: Intel pentium 4 CPU
DIGITAL INSTRUMENTS Keyboard
HBZ3CY400-4XX AFM Test platform manual mouse.
VEECO / DIGITAL INSTRUMENTS Dimension 3100 scanning electron microscope (SEM) is a versatile, high-performance research microscope designed for a variety of research applications such as materials analysis and nanofabrication. VEECO Dimension 3100 SEM is equipped with a high-resolution tungsten filament source, a large sample chamber, and a field emission source which together provide a range of capabilities including imaging, automated tomography, electron-beam lithography, microanalysis and material surface analysis. DIGITAL INSTRUMENTS Dimension 3100 features an integrated imaging equipment that allows users to take 3D images of structured and unstructured samples at resolutions ranging from sub-nanometer to micrometer. This allows for extremely precise measurement and imaging of material surfaces, enabling the study of structure and nanofabrication. The integrated image capture and analysis technology also allows for automated tomography for three-dimensional imaging of sub-micrometer materials. Dimension 3100 also features a field emission source, allowing for extremely precise nanoscale imaging and analysis. This feature allows for powerful microscopy systems that can detect and measure objects that are as small as 1nm across. Additionally, because of the field emission source, microscopists can achieve a depth of field that is 20x better than a conventional tungsten source. This improved depth of field allows for enhanced analysis of fine details. The large sample chamber of VEECO / DIGITAL INSTRUMENTS Dimension 3100 SEM also allows users to explore high magnifications on a variety of sample types. This chamber can handle samples with sizes ranging from very large (greater than 10 cm) to very small (less than 1 cm). It is also highly versatile, with a variety of holders available for analyzing large and small samples. Additionally, this SEM is also equipped with automated stage controls, allowing for precise x-y-z positioning of samples which further enhances the capability of this microscope system. Overall, VEECO Dimension 3100 scanning electron microscope is an incredibly precise and versatile microscope unit ideal for a number of research applications, due to its ability to detect details as small as 1nm, its large sample chamber, integrated imaging machine, and field emission source.
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