Used VEECO / DIGITAL INSTRUMENTS Dimension 3100 #9199313 for sale

VEECO / DIGITAL INSTRUMENTS Dimension 3100
ID: 9199313
Atomic Force Microscope (AFM) NS5 Controller Operating system: Windows 7 Vibration enclosure included.
VEECO / DIGITAL INSTRUMENTS Dimension 3100 is a scanning probe microscope (SPM) that combines a physical probe tip, a controller and a computer to enable imaging at the nanoscale level. It consists of a three-axis coarse scan stage and a two-axis vertical scan stage, both of which enable precise movement of the sample in the x, y, and z directions. The controller is equipped with a piezo-scanner to control the tip-sample distance, as well as piezo-driven x, y and z axes for positioning and feedback of the sample position. The controller and computer are both integrated into the same workstation for convenience and minimal setup time. VEECO Dimension 3100 offers two separate imaging modes: contact mode and non-contact (NC) mode. In contact mode, the microscope's tip is brought into contact with the surface of the sample and then scanned across it. Images are obtained by measuring the forces between the sample molecules and the tip of the probe. This mode is ideal for imaging soft and fragile materials. Alternatively, NC mode makes possible the imaging and manipulation of surfaces, where the tip is placed at sub-nanometer distances from the surface. Images can then be obtained by measuring differences in the tunneling currents between the sample and the tip of the probe. This mode is suitable for imaging and manipulating hard materials, such as semiconductors. DIGITAL INSTRUMENTS Dimension 3100 is also capable of real-time monitoring of surface processes using Scanning-Fourier-Viewing (SFV) technology, which records the phase or amplitude of the signal as it is received from the NSOM detector. Data is collected in an automated fashion without the need for user intervention, which provides the ability to analyse dynamic surface processes. In addition, the SFV mode also enables high-resolution spectroscopic imaging, which is useful for exploring surface-electronic properties and molecular-scale phenomena. Dimension 3100 is a cost-effective tool for nanoscale imaging and manipulation. Its integrated workstation eliminates the need for external data handling equipment and its user-friendly control software makes it easy to use. The software also enables easy data processing and visualization and provides a selection of graphical tools to enhance the analysis and interpretability of results. Its reliable imaging and manipulation capabilities, along with its efficient operation make it a great choice for nanotechnology research in the life sciences, material sciences, and electronics.
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