Used VEECO / DIGITAL INSTRUMENTS Dimension 3100 #9410551 for sale

ID: 9410551
Atomic Force Microscopes (AFM).
VEECO / DIGITAL INSTRUMENTS Dimension 3100 is an advanced scanning probe microscope (SPM) built by VEECO, a DIGITAL INSTRUMENTS company. It is designed to measure properties such as surface topography, conductivity, and magnetic properties on a wide range of samples. VEECO Dimension 3100 has a number of unique capabilities that make it versatile and suitable for a variety of research fields such as materials science, semiconductor fabrication and engineering, biology, nanotechnology, and biotechnology. DIGITAL INSTRUMENTS Dimension 3100 is equipped with a joystick-controlled scanning head and a high resolution, monochrome CCD camera for sample imaging. The scan head is controlled via the joystick for moving the cantilever with nanometer-scale resolution. This allows the user to conduct research on extremely small components with a high degree of accuracy. This unique platform enables researchers to investigate both static and dynamic behavior at individual atoms and even smaller scales. It has the ability to acquire data at a rate of up to 1.5 gigapixels/second. Furthermore, this instrument can also be used to control and measure localized temperature variations of as small as 10 picokelvin with a time resolution of 10 nanoseconds. The instrument can also be used to measure surface topography and electrical properties such as conductance and work functions. For this purpose, the instrumentis equipped with a piezo-scanner, which is used to scan the sample surface. Imaging is done with a combination of scanning force, atomic force, and contact mode microscopy. It also offers drift compensation for achieving highest precision topography and conducting measurements. Dimension 3100's flexible software system allows the user to conduct an array of experiments from a single platform. The graphical user interface is especially user-friendly, and includes a wide selection of macro-level operations such as creating series of images, collecting statistics from a batch of images, and more. Special data analysis techniques such as Flicker mode, analysis of images from multidimensional datasets, and 3D surface plotting help increase the accuracy of measurements. For users who require additional features, upgraded versions of the instrument can be purchased. These versions provide additional features such as increased traverse speed, expanded field of view, enhanced imaging speed, extended dynamic range and improved temperature stability. Overall, VEECO / DIGITAL INSTRUMENTS Dimension 3100 is a valuable tool for scientific research. It offers a number of unique capabilities that make it particularly suitable for a variety of research fields. In addition, its user-friendly interface and advanced software system make operation easy and intuitive.
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