Used VEECO / DIGITAL INSTRUMENTS Dimension X #9249381 for sale

VEECO / DIGITAL INSTRUMENTS Dimension X
ID: 9249381
Vintage: 2005
Atomic Force Microscope (AFM) 2005 vintage.
VEECO / DIGITAL INSTRUMENTS Dimension X is an advanced Scanning Electron Microscope (SEM) poised to revolutionize the microscopic imaging industry. It features multiple detectors, including visible light, UV, cathodoluminescence, backscattered electrons, secondary electrons, Auger electrons, X-ray fluorescence, and automated atomic force. These detectors provide for high-resolution imaging with clarity and detail that is far superior to other SEMs currently on the market. VEECO Dimension X utilizes a unique double beam geometry that makes both the primary and secondary beams nearly parallel. This provides for improved spatial resolution in the image, allowing precise imaging of small specimens. In addition, the double beam geometry provides enhanced depth of field, enabling the user to capture content from deeper within the specimen. DIGITAL INSTRUMENTS Dimension X is both user-friendly and powerful. It features a streamlined graphical interface and a 6 axis joystick for precise manual manipulation of the x-y-z stage, allowing the user to accurately control the specimen movement. Advanced software packages are available to further facilitate usage, including user- friendly process control tools required for high-end operations such as EBSD, EDX, WDS, SED, and CL. Dimension X offers outstanding performance of low kV imaging for better imaging and improved yield. Features like an enhanced instrument package, true 3D imaging, sub-aeolian deflection capability, automated spot switching, and a fully automated AutoAlign system top the list of added features that this SEM offers. In addition, VEECO / DIGITAL INSTRUMENTS Dimension X is configurable to meet the needs of its users. Modular design allows the user to easily add, remove or exchange detectors or substitue various guns and lenses for a broad range of applications. It even offers expansion options to permit the use of external detectors to further extend the versatility and capabilities of the unit. VEECO Dimension X is an excellent choice for the most challenging analysis and imaging projects. Its high resolution scanning capabilities combined with its powerful analytical suites offers an unmatched combination of performance and value. It is indeed a powerful and dependable tool for anyone looking for a microscope that offers unbeatable performance.
There are no reviews yet