Used APPLIED PRECISION / RUDOLPH PRV #9195331 for sale

ID: 9195331
Probers 320-Channels.
RUDOLPH Prober is a probe station designed to measure, test and characterize semiconductor devices and their components. It is optimized for applications involving automated testing and analysis, which require high precision and repeatability. The Prober is composed of several main components: a positional stage, electronic modules, a power supply unit, temperature control unit and a motor controller. The positional stage is designed to reliably and accurately measure the locations and distances of various probes on the device. It includes an X-Y linear motion system that can be configured for various sizes and shapes of product dice/target, in addition to a manual tilt mechanism to modify the sample orientation if needed. The stage has two separate head control units to provide the necessary accuracy to measure. The electronic modules used in the Prober are a combination of microscope, camera, video and control cards. This combination of components allows the user to monitor, measure, polarize and probe the target device with great control and precision. The microscope is used to observe the sample and the camera is used for viewing and measurement, while the video card is used to capture images of the sample. The Power Supply Unit (PSU) in the Prober provides the necessary power for the operation of the device under test. It combines two power sources: a fixed 24Vdc main power (for the stage and microscope) and an adjustable 0-46Vdc secondary variable power source for higher voltage tests. The Temperature Control Unit (TCU) is used to monitor and control the temperature of the Prober, ensuring the stability and accuracy of the device under test. It uses a fan and a heat-sink to maintain the temperature within pre-set levels. Finally, the Motor Controller manages the operation of the X-Y and Z axis of the Prober. It is responsible for applying motor directives and for monitoring the motion of the various elements of the system. In summary, APPLIED PRECISION Prober is an advanced system designed to accurately measure and test semiconductor devices and components with high precision and repeatability. It offers high levels of control, stability and accuracy, and is optimized for automated testing and analysis.
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