Used ELECTROGLAS 4080X TC2000 #293601662 for sale

Manufacturer
ELECTROGLAS
Model
4080X TC2000
ID: 293601662
Prober.
ELECTROGLAS 4080X TC2000 is an advanced prober developed by ELECTROGLAS company, a leading provider of innovative capabilities for integrated probing solutions. The TC2000 provides excellent accuracy, repeatability and yield optimization when probing wafer electronics, microelectronic circuitry and advanced packaging. It is particularly useful for break/segment testing, microelectronic testing and parallel testing. The TC2000 is a compact and lightweight prober, capable of probing thin-film chips and ICs as thin as 20 microns. It features a 20-pole XYZ stage driven by direct-drive torque motors, providing up to 200,000DZ (DF resolution) with a minimum step size of 1µm and a speed of up to 150 mm/s. The TC2000 also features an adaptive probe head and a new high-resolution vision equipment. The probe cards and needles used with the TC2000 are designed to reduce test time and save cost. They feature a wide array of contact sizes and styles, including spring loaded and flat surface options. The cards also feature tough ceramic tips that allow for high-pressure probes without chipping or breakage. The TC2000 is an advanced robotic prober equipped with a powerful control system to handle increasingly complex tests. It includes a real-time operating unit, a colour touchscreen user interface and a Windows®-based program for easy data analysis. Additionally, the TC2000 is equipped with a variety of I/O functions to support complex testing requirements. The TC2000 is also equipped with built-in safety features such as an etched ground plane, an anti-static machine, and an advanced sealing tool to protect the probe needles from contamination and damage. This makes it an ideal choice for high-reliability testing. The TC2000 is a reliable and versatile advanced prober that provides excellent accuracy, repeatability and yield optimization. With its high-precision XYZ stage and powerful control asset, the TC2000 is an ideal choice for probing thin-film chips, complex ICs and advanced packaging.
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