Used ELECTROGLAS 4080X #293594832 for sale

Manufacturer
ELECTROGLAS
Model
4080X
ID: 293594832
Prober Temperature: 98°C - 100°C.
ELECTROGLAS 4080X is a micro-probing equipment designed for mechanical testing, failure analysis, and wafer probing of advanced semiconductor devices. This platform is ideal for wafer-level probing in a wide range of packages and on any pitch size. The system is unique in its adaptability, offering a wide range of options to work with any size, configuration, and combination of I/Os on any pitch. The unit is capable of high-precision nanometer-level probing on any configuration with its state-of-the-art vibration isolation table and low headroom requirements due to its 5-axis arm positioning. The platform is configurable with a heavy-duty linear motor powered (XY) stage, which offers a large XY working area, high speed, and repeatable accuracy. The linear stage can accommodate thousands of I/Os with no compromise on beam lifetimes due to its robust design and advanced 5-axis arm positioning. Additionally, the high-resolution, low-noise laser interferometer provides machine diagnostics and control. The prober incorporates two different optical systems, one for optical inspection and one for imaging the device under test. This ensures that the device under test is accurately aligned with the probes. An additional secondary alignment machine and auto focus routine is also included to ensure proper contact is made with the device. The tool is loaded with features such as remote performance monitoring, high-level programmability, automation tools, and 15-inch touchscreen interface. The touchscreen allows the user to initiate, monitor, and control the automated sprobing process. The asset's software suite is also user-friendly and feature-rich, allowing users to customize and program the machine with the user's own logic and applications. This software suite also supports online device programming with the option to save, share and transfer the test results. 4080X is designed for high-volume advanced semiconductor device testing and is ideal for those who require repeatable and accurate probing results. The overall setup guarantees performance, repeatability, accuracy, and faster probing cycles.
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