Used ELECTROGLAS 4080X #9120978 for sale

Manufacturer
ELECTROGLAS
Model
4080X
ID: 9120978
Prober.
ELECTROGLAS 4080X is a high-performance prober designed for the most demanding wafer testing environments. This prober comes equipped with a full range of features which make it one of the most advanced, comprehensive probe systems on the market. The prober itself has a weight of approximately 5,000 pounds and features 82.5 inches of clearance and a footprint of only 51 x 69 inches. It is constructed with a steel frame, thermal insulation and vibration dampening, as well as an advanced temperature control system. The probe system is powered by a Windows 10 Pro operating system and is equipped with a robotic arm and test head. At the heart of 4080X is its high-performance patented 4-axis spherical head and Z-Axis linear actuator. The spherical head provides the highest level of accuracy and repeatability available in any prober, ensuring that samples are placed accurately and consistently. The Z-Axis linear actuator allows for precise adjustments in the placement of samples, regardless of the thickness of the end-user wafers being tested. ELECTROGLAS 4080X also features multiple test head configurations, making it an ideal choice for a variety of test applications. Up to sixteen channels can be used simultaneously to measure and compare data from multiple devices at once. The prober can be customized for specific test functions through the availability of an extensive selection of additional features, such as capacitance card, low-frequency probe, resistive probe and laser marker. Equipped with optical interface, 4080X enables automatic transfer and visualization of wafer data. This includes accurate measurements, graph plotting and results analysis, allowing for efficient test cycle time. Overall, ELECTROGLAS 4080X is a reliable and robust prober that offers superior performance and maximum accuracy in a wide range of applications. Its advanced features and precision capabilities make it an ideal tool for those looking for top-level probes in the most demanding environments.
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