Used ELECTROGLAS 4085X #9003468 for sale

ELECTROGLAS 4085X is a precision Probe Station for product final test, engineering development and wafer-level characterization. It is designed to provide a steady base for the mounting of Waffle Packs and other wafer substrates in order to perform contact testing, electrical analysis and high temperature operations. Designed to provide advanced probe positional control and precision parallelism, 4085X features an adjustable mechanical design to maximise utilization on high pin-count devices while also providing optimum access to all test components. An ergonomic design allows for convenient usage of confocal microscopes, allowing tests to be performed on die and packaging sites with ease. ELECTROGLAS 4085X offers a highly accurate, low force, low inertia laser vector driven vertical and horizontal motion and provides high speed accuracy and repeatability. The die and contact adapter requires minimal adjustment for new device types and bonding pads, making switching product lines easy and efficient. Also integral to 4085X is a lift platform adjusted using a patented mechanical design which enables maintenance and probing of intricate pitch devices. The platform's vacuum chips are easily replaceable, and interchangeable contact assemblies allow for quick, cost effective job switching. ELECTROGLAS 4085X supports the high power testing of devices including power supply handling and logic testing. The station integrates with a variety of test equipment including semiconductor circuit analysers, device/package fault locators, curve tracers and more. It is also fully compatible with existing wafer probe cards. 4085X is a staple in semiconductor development, offering an impressive range of performance, accuracy and reliability. The design is compact for quick installation into existing R&D and high volume production lines, providing a comprehensive solution for testing of all devices with minimal time wastage.