Used GGB INDUSTRIES Model 40A #293621308 for sale

Manufacturer
GGB INDUSTRIES
Model
Model 40A
ID: 293621308
Picoprobe P/N: SG-250-PC.
GGB INDUSTRIES Model 40A is a powerful prober used in semiconductor production and testing. It is a high-precision tool that can be used to accurately measure small electrical characteristics on circuits. Model 40A has a number of features that make it well suited for precision work. It is equipped with a built-in powerful motor, which enables it to achieve maximum probing accuracy. It is also equipped with a fully programmable digital control unit, which can be used to control the speed and direction of the probe, as well as record results. GGB INDUSTRIES Model 40A is designed to be used with a wide range of semiconductor materials, including silicon, gallium arsenide and indium phosphide. It is capable of testing both on-wafer and off-wafer devices, as well as measuring both resistance and capacitance values. The probes can be preset for specific test parameters, as well as calibration to set the desired accuracy. The modular design of Model 40A allows it to be customized to the needs of any specific application. It is equipped with a range of various sensors and measuring instruments, including temperature, current and voltage probes. It is also equipped with a high resolution XY stage, which can be moved quickly and accurately by a joystick control. GGB INDUSTRIES Model 40A has a large display with a variety of menus that can be used to manage the parameters of the testing procedure. This includes basic settings and advanced options. The instrument also contains limits executive software, which helps in setting up the testing conditions and defining the desired range of tolerances. The major advantages of Model 40A include its accuracy, high speed and reliable operation. Its modular design makes it easy to maintain and repair, and its robust construction makes it suitable for a wide variety of testing environments. GGB INDUSTRIES Model 40A is a reliable and powerful tool for measuring small electrical characteristics on semiconductor components.
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