Used MICROMANIPULATOR 8860 #9155817 for sale

Manufacturer
MICROMANIPULATOR
Model
8860
ID: 9155817
Wafer Size: 8"
Semi auto prober, 8" Hot & cold chuck Computer driven chuck Microscope (X, Y and focus) Vibraplane isolation table Anti vibration table Light tight box Dark box with coax and triax Joy stick PC Controller Video camera Fiber optic microscope illumination Missing parts: Cable Currently warehoused.
MICROMANIPULATOR 8860 prober is an advanced electrical testing instrument that is designed to provide direct contact probing of ultra-fine structures. It is capable of probing to depths of up to 100 nanometers. This capability makes it ideal for probing the interior of microelectronic devices and fine structures in integrated circuits and other microwires. 8860 utilizes a unique multi-axis scanning stage, allowing four-dimensional x-y-z-t scanning of structures. This four-axis design allows for fine resolution of structures in three dimensions. Furthermore, the multi-axis scanning stage allows the probe tip to reach into difficult-to-access areas of the target structure. The probe utilizes an air-bearing system to reduce the friction felt by the probes on the surface of the target. This system reduces wear and tear on the probe itself, dramatically reducing the need for periodic retipping. Additionally, the probe tip itself is replaced by a tetrahedral tip for better accuracy. MICROMANIPULATOR 8860 further integrates a host of other features designed to increase the accuracy and resolution of the measured data. This includes a high-gain amplifier that boosts signal strength, as well as an active SMA port for connecting external electronics and signal processing circuitry. 8860 also includes a superimposed mesa-like structure to ensure that the probes contact the desired locations with the correct amount of force. Overall, MICROMANIPULATOR 8860 is an incredibly powerful probing system capable of achieving extraordinarily fine resolution in probing structures. Its use of air-bearing and special tip technologies minimize wear and tear on the probe itself, allowing it to be used for innumerable trials. Additionally, the inclusion of signal amplification and external connection options make it an excellent choice for a variety of applications.
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