Used MPI LEDA-AS M76XL #9181644 for sale

MPI LEDA-AS M76XL
Manufacturer
MPI
Model
LEDA-AS M76XL
ID: 9181644
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MPI LEDA-AS M76XL is a high performance wafer probing equipment that provides precise probing and measurement to deliver results of the highest accuracy. The machine is highly automated with various advanced features such as a wafer handling and alignment system, which facilitates accurate and fast probing for different wafer sizes and types. It is equipped with a high speed laser alignment unit that can align many wafers in just a few seconds. It also features an innovative Fault Detection and Isolation (FDIS) technology, allowing automatic detection and isolation of faults related to probe or device. This prober features a semi-auto programmable machine and a user friendly C language command set. The Automated Sample Tool (ASS) provides fast loading, consistent alignment and reliable wafer transfer. This wafer handler can be used to probe multiple die sizes and types. Additionally, it features specialized sensors that allow for high accuracy and precision in probing. LEDA-AS M76XL is designed to run up to 18 probes, with an adjustable probe force from 0 to 16g. With a maximum throughput of up to 5,200 wafers per hour, it is ideal for probing small lots of wafers for failure analysis or large runs for sampling. The exchangeable auto focus optics, along with the motorized stage provides precise movement in all three axes. Thanks to its built-in built-in vector matrix prober control asset, MPI LEDA-AS M76XL provides a high degree of accuracy and flexibility. This model allows for complete automatic calibration, programmable signal switching and high speed capability. Also, the equipment supports a wide variety of S-parameter analysis and advanced probing applications. All in all, LEDA-AS M76XL is a great wafer probing system that is equipped with advanced features such as wafer handling and alignment, fast laser alignment, auto fault detection and isolation, along with vector matrix prober control unit, providing excellent results for failure analysis and sampling purposes.
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