Used QMC DPS 600 #9315237 for sale

QMC DPS 600
Manufacturer
QMC
Model
DPS 600
ID: 9315237
Wafer Size: 6"
Vintage: 2011
Die prober, 6" Chip size: 300 um x 300 um - 1,500 um x 1,500 um Typical cycle time: 0.21 Sec / Chip (10) Wafer cassette slots BIN Cassette slot: 64 BIN Sorting accuracy (X, Y-Axis): ±30 um Sorting accuracy (Theta Axis): ±3° Sapphire, 4" 2011 vintage.
QMC DPS 600 is a prober specifically designed for semiconductor testing and wafer probing. It combines precision with flexibility, offering a high throughput scanning capability and extensive automation features. DPS 600 is a fully automatic wafer prober with the capacity to scan up to 8" wafers with completely automated and reliable device testing. It is designed for both benchtop and production testing, offering ultimate flexibility and productivity. QMC DPS 600 features a high speed scan which demonstrates unbeatable throughput of over 600 double site probing steps. With a scanning range of up to 8" wafers, it provides an extensive accuracy and repeatability for device characterization and high-throughput testing. DPS 600 is capable of a scan speed of up to 200 cm/sec for high-speed testing. The prober is also equipped with robotic mechanisms, accommodating high throughput processing and extended reach to allow access to larger devices. The gantry robot utilizes a precision constructed fixture system which facilitates the rapid positioning of different wafer sizes while achieving superb repeatability accuracy. It is also accompanied by an automated die mapping capabilities for further characterization of devices. QMC DPS 600 is also capable of testing on glass carriers with a max heights of up to 40mm. It also helps eliminate cross-contamination with its drop on demand lift pins that allow a controlled dispensing of liquids. The unit comes with a comprehensive suite of software, including a graphical user interface for easy customization, SPC and OQC tests, and data interface for linking to ATE systems or user controlled front-end systems. It also provides a real-time synchronized system monitoring that facilitates debugging and process development. In all, DPS 600 is an efficient and fully automated wafer prober that offers high speed scanning and extensive automation for thorough device testing. It is an ideal tool for achieving accurate, reliable, and high-throughput test results.
There are no reviews yet