Used QMC DPS 600 #9379306 for sale

QMC DPS 600 (Dynamic Publications Semiconductor) is a prober used in semiconductor device manufacturing. It is designed to provide accurate and repeatable metrology readings of components on an integrated circuit (IC). DPS 600 uses both a four-tip scanning head and a linear detection system to measure features such as etched patterns, oxide thickness, and resistance. It is also capable of measuring on-wafer circuit characteristics such as Vt, drain-source resistance, gates, transistors, diodes, and capacitors. The prober utilizes a high-speed motion system to quickly move between test points and take measurements without compromising accuracy. It is powered by a high-resolution CCD camera that can detect even the smallest features within a wafer. The tool is also equipped with a highly accurate manual wafer aligner that allows the operator to manually position wafers before being probed. This aligner feature has a repeatability of ±3 microns. The prober has unique features such as multiple-depth probing, that allows it to take simultaneous measurements on multiple layers, and support for high-temperature probing, which is useful when probing transistors and other temperature-sensitive devices. The tool also comes with a touch screen user interface that simplifies the operation of the prober. QMC DPS 600 allows for a variety of test points to be programmed in order to maximize its accuracy and repeatability. It supports both single- and double-sided probes, and is capable of handling wafers up to 200 mm in diameter. The tool also features various connectivity options such as IEEE 1394, USB, and RS232 to allow for data transfers to 3rd party systems. DPS 600 is an advanced prober that offers excellent accuracy and repeatability. Its features make it an ideal solution for semiconductor device manufacturers who require precise and repeatable metrology readings. The tool also has a user-friendly design that simplifies the operation and makes it easier for operators to use.