Used QMC DPS 600 #9379307 for sale

Manufacturer
QMC
Model
DPS 600
ID: 9379307
Die prober.
QMC DPS 600 is a highly advanced semiconductor prober designed for wafer probing and wafer sort testing. This tool helps to quickly and accurately assess the electrical performance and reliability characteristics of the wafer or other types of semiconductor devices. DPS 600 is designed with an integrated load frame and prober body. The high-resolution multi-axis motion and pattern recognition capability of the fully automated prober makes it a great choice for high-throughput and high-accuracy probing jobs. Its multi-axis motion control equipment allows the prober to accurately probe at multiple points in an unlimited number of directions. The prober is designed to be highly precise, accurate and repeatable in all its operations. QMC DPS 600 has a variety of sensors, including a laser scanner, wafer splitter, electrical sensors, and a vision system. The laser scanner precisely detects and measures the on and off-state electrical characteristics of the wafer. The wafer splitter precisely identifies and splits the wafer into four equal sections. The electrical sensors accurately measure the electrical characteristics of each section. Finally, the wafer-mount vision unit captures and analyzes the surface of the wafer with extreme accuracy. The complete assembly of DPS 600 includes a computer-controlled positioning and shuttle mechanism, a high-speed video camera, and a laser machine for fine-tuning measuring mechanism. The integrated probing station and shuttle control provide flexibility in the capacity to precisely control the movement of the probe from one contact point to another. The high-speed video camera captures and stores images of the probe contacts as they pass through different points. The laser tool helps to fine-tune the probes' alignment to ensure accuracy in the placement of contacts. QMC DPS 600 has a low cost per wafer incident count, and high throughput due to its ability to measure multiple points on the same wafer. Its multi-axis motion control and pattern recognition capabilities deliver the most accurate and repeatable results. Furthermore, its onboard software has powerful calibration and diagnostics options, greatly increasing its effective use. Overall, DPS 600 is a reliable, accurate, and cost-effective automated prober which is an ideal choice for high-throughput wafer probing and wafer sort testing needs.
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