Used QMC DPS 600 #9379314 for sale

Manufacturer
QMC
Model
DPS 600
ID: 9379314
Die prober.
QMC DPS 600 is a prober that is designed for semiconductor testing and related applications. It is used for probing, sorting, and device characterization of diverse electrical and IC devices. The prober has a robust design and can handle high acceleration and speeds for single wafer applications as well as a wide range of small parts probing. It features multi-axis adjustable head height and wafer rotation for alignment of probes with the devices under test. DPS 600 has a vacuumhead design, which allows for substrate placement at an optimal height for electrical probing. The high-resistance scrubbed chuck offers uniform wafer clamping. The prober is equipped with software-controlled electrical testing, one- and multi-site probing, laser alignment and a host of other features. It has a single-compact-package option, which allows for a convenient and reliable set up of multi-forums on the single probe without interfering with the setting of the machine. The prober has an ETC compatible wafer handling system. The system has a 150mm subscriber chuck and a 200mm automated cassette elevator. It also features automatic cassette to substrate transfer. QMC DPS 600 is equipped with a high-resolution stage with a speed of up to 10,000 rpm. The prober also has automatic thermal compensation, allowing for accurate probing at a wide range of temperatures. The prober is highly reliable and offers ultimate accuracy with a closed loop control system. It has a flexible and power supply, which allows for easy setup, testing and operation. DPS 600 is suitable for high volume probing and testing of various IC devices. It is a highly efficient and cost-effective solution for testing and sorting various types of devices.
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