Used QMC DPS 600 #9379316 for sale

Manufacturer
QMC
Model
DPS 600
ID: 9379316
Die prober.
QMC DPS 600 prober is a professional wafer probing device designed for testing and debugging semiconductor integrated circuits. It features a Macor-coated stage, ensuring smooth and accurate scanning and alignment. The prober also offers adjustable needle positioning, allowing for precise control of test parameters. DPS 600 can be used to analyze a variety of parameters including, transistor characteristics, delay times, operational voltages, leakage current, and other critical values. It provides fast scanning speeds, with probing stepping up to even the most complex components. It offers quick and flexible scan settings, allowing users to easily adjust parameters to the specific test being performed. The prober's design consists of a main unit, needle positioner, needle test head, and scanning control software. The main unit houses the Macor-coated stage, enabling smooth and accurate movement and positioning of the needle. The needle positioner offers adjustable z-axis motion, which allows users to position the needle accurately according to the desired test parameters. The needle test head provides measurement control and allows for accurate needle movement. Finally, the scan controller software is used to configure the position of the needle, monitor test progress, and control various parameters of the test. QMC DPS 600 offers advanced functionality and accuracy. It is capable of testing small chip elements ranging from 0.5 to 17 mils and is resistant to virtually all ambient and process conditions. It is designed with advanced software that can be used with a computer or stand-alone and provides a user-friendly interface for controlling the performance of the prober. Overall, DPS 600 prober offers exceptional performance and precision. Its Macor-coated stage, adjustable needle positioning, quick scan settings, and advanced software make it an ideal choice for testing integrated circuits. Its use of advanced technology ensures accurate readings for a variety of tests and applications.
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