Used SEMICS OPUS 2 #9209248 for sale

SEMICS OPUS 2
Manufacturer
SEMICS
Model
OPUS 2
ID: 9209248
Wafer prober.
SEMICS OPUS 2 is a prober for testing various electronic components on circuit boards or electronic assemblies. It is designed to operate in an industrial environment and is suitable for testing semiconductor devices, such as transistors, diodes, CCDs, FETs, SCRs, and integrated circuits. It can also be used for ordinary resistors, capacitors, inductors, and other components. SEMICS OPUS2 prober is built for high-reliability multi-probe and control equipment that can rapidly detect electrical defects on IC packages. It is equipped with an advanced optical detection system that allows for precise and non-destructive measurements of the electrical properties of the tested components and it is able to identify device-level failures quickly. With its multi-channel synchronization technology, the prober is capable of controlling up to five probes in parallel, providing industry-standard testing solutions to validate the performance of a wide variety of devices. The prober is equipped with a high-performance vision unit that allows for rapid mapping of all tested components. The vision machine also captures images of defective test points, which can be quickly identified and resolved. The prober supports various types of test equipment, such as wafer bondtesters, die bonders, flat panel display testers, and more. Access to the testing results can be achieved remotely via an integral server that can be hooked up to a local computer or a web application. OPUS 2 prober features an automatic calibration tool that monitors asset performance and compensates various external factors such as environment and process conditions. The prober's condition monitoring capabilities ensure that it is always running within optimal parameters and its automated report generation ensures that operators can easily and accurately track test results. In conclusion, OPUS2 prober is a reliable and powerful tool for testing various types of electronic components. Its advanced optical detection model, multi-channel synchronization technology, vision equipment, and other features enable it to provide high-precision testing and automated report generation for a wide range of electronic devices.
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