Used SEMICS Opus II #293606570 for sale

SEMICS Opus II
Manufacturer
SEMICS
Model
Opus II
ID: 293606570
Probers.
SEMICS Opus II is a full-function production prober for testing the electrical parametrics of diverse semiconductor devices. The prober's features include precise motion control capability, intelligent test equipment, automatic probing and mode selection, and wafer mapping capabilities. With its strong modular design, Opus II prober can be easily configured and reconfigured for wide range of device parametrics testing applications. SEMICS Opus II features precision motion control, with accuracy of up to 0.5 μm. This allows for precise positioning and probing of multi-site test structures. It is also equipped with advanced wafer mapping capabilities to accurately locate device locations and perform high-speed probing. Combined with high-throughput testing protocols, the prober achieves high productivity of up to 25 wafers per hour. The user-friendly and intuitive prober interface allows for easy programming, execution, and configuration of tests. It also supports a wide range of testing protocols, including T&B and NAKED TTL. The built-in automation system further simplifies the test setup and execution procedures and provides greater flexibility. This unit can automatically detect the probe type, as well as select the correct probing mode or operation protocol depending on the specific test application. Additionally, Opus II prober is equipped with robust data validation, analysis, and storage functions. The machine stores data generated after tests, and the validation and analysis can be done later on using the adjustable UI. Tests, results, and program files can all be backed up in the prober's memory, allowing for easy data transfer and sharing with other systems. SEMICS Opus II prober is a reliable, full-featured testing instrument designed to meet the needs of today's semiconductor device manufacturers. With its superior performance and versatile operating tool, the prober is ideal for high-precision wafer testing, providing a reliable and cost-efficient solution for the customer's device quality assurance process.
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