Used SEMICS Opus II #293644080 for sale

SEMICS Opus II is a prober specifically designed for the demanding requirements of advanced wafer inspection. The prober integrates high-precision motion and fluid control, advanced imaging and automation capabilities. It is capable of handling a wide range of wafer sizes, from as small as 1mm to as large 12 inches in diameter. It also features an integrated vision system that can detect defects down to 0.05 microns, making it a reliable and accurate tool for inspecting the most intricate nanostructures. The prober operates with a self-contained operating system and a user-friendly graphical interface, allowing for easy and efficient wafer inspection. It is equipped with an adjustable stage that allows for sample shifting and positioning, enabling reliable wafer alignment and positioning for accurate inspection. It is also equipped with dedicated alignment and steering systems that provide rapid and accurate navigation to each sample's measurement location. The prober features a powerful imaging system that utilizes exceptionally sharp resolution with a range of contrasts and sensitivities, enabling accurate verification of micron-scale features. Its full-spectrum lighting and advanced optics provide a three-dimensional image of the inspected wafer, providing unparalleled insight into wafer defects. The prober also features an integrated FOUP (front-opening unified pod), allowing for secure and reliable sample handling. It is also equipped with a CCD camera, an LCD touchscreen, and an integrated thermal controller, providing reliable data acquisition and reproducible results. The prober also includes several software programs to manage and automate sample processing and analysis. These programs include an easy-to-use program editor, which allows for rapid creation of custom data-collection protocols, as well as automated statistical data analysis. Opus II is the perfect tool for sophisticated wafer inspection, providing the most reliable and accurate wafer inspection capability for advanced nanotechnologies. It offers a fully automated, high-throughput solution for reliable wafer inspection, and it is ideal for wafer verification, defect analysis, process evaluation, and product development.