Used SEMICS Opus II #9236854 for sale

SEMICS Opus II, from SEMICS International, is an automated prober for semiconductor device probing and test. The tool is designed to optimize and streamline the rigorous test and validation process required for today's high-speed semiconductor devices. Opus II combines many sophisticated, proven technologies into one modular platform. The prober's base unit provides an efficient sample handling and transportation equipment that allows users to quickly probe devices set up in any test configuration. Strategically placed vacuum chucks and electrostatic chucks provide fast tool access for secure part retention on both top- and bottomside test setups, while ensuring reliable electrical contact every time. The system also features a large blank tape rewinding capability that allows multiple testing scenarios to be used simultaneously. The probing unit includes four different probe heads, each optimized for specific probing applications. The "Touchdown" head is a high-speed contact-mode workhorse that ensures reliable contact with high-density, small signals, while the "CAE" head is optimized for contact-less probing on up to 1000 contacts at once. The "Nightmare" head is ideal for deep reaching contact-mode probing on devices with complex routings. Finally, the "Trailblazer" head is designed to test high-speed external signals and high-density interconnect devices with its high-power switching technology. In addition, the optimised control machine of SEMICS Opus II ensures fast test speed and high throughput. Through several automated procedures, the tool carrier can be accurately moved to the measurement location or monitored in real-time during probing. The software packages supplied with the tool include a complete test sequencer, so users can quickly create automated test sequences that can control production testing on the featured carriers. Finally, the open architecture of Opus II enables integration into automated production lines or test systems. Interface options for the prober include a wide range of communication protocols, such as GPIB, RS-232, USB, Ethernet, and more. Other useful productivity-enhancing features of the tool include database synchronization, OCR recognition, label printing and unique features like a PC-controlled temperature chamber, thermal chuck, and cryogenic chuck temperature control. Overall, SEMICS Opus II is a powerful and highly advanced prober asset that takes device probing and test to a whole new level. It combines advanced probing technology with a flexible, open architecture and efficient test control to ensure maximum testing accuracy and efficiency in a wide range of applications.